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ET
2000
145views more  ET 2000»
15 years 6 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar
EMNLP
2010
15 years 4 months ago
A Simple Domain-Independent Probabilistic Approach to Generation
We present a simple, robust generation system which performs content selection and surface realization in a unified, domain-independent framework. In our approach, we break up the...
Gabor Angeli, Percy Liang, Dan Klein
JMLR
2011
167views more  JMLR 2011»
15 years 1 months ago
Logistic Stick-Breaking Process
A logistic stick-breaking process (LSBP) is proposed for non-parametric clustering of general spatially- or temporally-dependent data, imposing the belief that proximate data are ...
Lu Ren, Lan Du, Lawrence Carin, David B. Dunson
JMLR
2010
156views more  JMLR 2010»
15 years 1 months ago
Classification with Incomplete Data Using Dirichlet Process Priors
A non-parametric hierarchical Bayesian framework is developed for designing a classifier, based on a mixture of simple (linear) classifiers. Each simple classifier is termed a loc...
Chunping Wang, Xuejun Liao, Lawrence Carin, David ...
FOCS
2008
IEEE
16 years 1 months ago
Degree Bounded Network Design with Metric Costs
Given a complete undirected graph, a cost function on edges and a degree bound B, the degree bounded network design problem is to find a minimum cost simple subgraph with maximum...
Yuk Hei Chan, Wai Shing Fung, Lap Chi Lau, Chun Ko...