3433 search results - page 559 / 687 » Heuristics for a bidding problem |
167
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VTS
2008
IEEE
16 years 24 days ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
163
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WCNC
2008
IEEE
16 years 24 days ago
2008
IEEE
Abstract—We tackle the problem of providing minimum datarate guarantees for different classes-of-service in an OFDMAbased network, while obtaining a high system throughput. Our a...
144
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ETS
2007
IEEE
16 years 23 days ago
2007
IEEE
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
172
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HICSS
2007
IEEE
16 years 23 days ago
2007
IEEE
The problems involved in the development of user interfaces become even more severe through the ubiquitous use of a variety of devices such as PCs, mobile phones and PDAs. Each of...
176
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HPDC
2007
IEEE
16 years 23 days ago
2007
IEEE
Utility functions can be used to represent the value users attach to job completion as a function of turnaround time. Most previous scheduling research used simple synthetic repre...