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184
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CHI
2005
ACM
16 years 7 months ago
2005
ACM
From pre-schools to high schools, at home and in museums, the educational community has embraced the use of computers as a teaching tool. Yet many institutions will simply install...
198
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VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
Title of thesis: EFFICIENT AND ACCURATE STATISTICAL TIMING ANALYSIS FOR NON-LINEAR NON-GAUSSIAN VARIABILITY WITH INCREMENTAL ATTRIBUTES Ashish Dobhal, Master of Science, 2006 Thes...
205
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VLSID
2004
IEEE
16 years 7 months ago
2004
IEEE
As chip complexity grows, design productivity boost is expected from reuse of large parts and blocks of previous designs with the design effort largely invested into the new parts...
167
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VLSID
2002
IEEE
16 years 7 months ago
2002
IEEE
External pins for test are precious hardware resources because this number is strongly restricted. Cores are tested via test access mechanisms (TAMs) such as a test bus architectu...
186
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VLSID
2001
IEEE
16 years 7 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...