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    2008
    IEEE
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    Towards fault tolerant parallel prefix adders in nanoelectronic systems
    16 years 1 months ago
    Towards fault tolerant parallel prefix adders in nanoelectronic systems
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    Wenjing Rao, Alex Orailoglu
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    DATE
    2008
    IEEE
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    On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits
    16 years 1 months ago
    On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits
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    Aswin Sreedhar, Alodeep Sanyal, Sandip Kundu
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    DATE
    2008
    IEEE
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    Quantitative Evaluation in Embedded System Design: Predicting Battery Lifetime in Mobile Devices
    16 years 1 months ago
    Quantitative Evaluation in Embedded System Design: Predicting Battery Lifetime in Mobile Devices
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    Lucia Cloth, Boudewijn R. Haverkort
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    DATE
    2008
    IEEE
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    A Delay-efficient Radiation-hard Digital Design Approach Using CWSP Elements
    16 years 1 months ago
    A Delay-efficient Radiation-hard Digital Design Approach Using CWSP Elements
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    Charu Nagpal, Rajesh Garg, Sunil P. Khatri
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    DATE
    2008
    IEEE
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    Dependability for high-tech systems: an industry-as-laboratory approach
    16 years 1 months ago
    Dependability for high-tech systems: an industry-as-laboratory approach
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    Ed Brinksma, Jozef Hooman
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