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ISQED
2003
IEEE
147views Hardware» more  ISQED 2003»
15 years 12 months ago
On Structural vs. Functional Testing for Delay Faults
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing constraints or both. Experimental data suggests that there...
Angela Krstic, Jing-Jia Liou, Kwang-Ting Cheng, Li...
ISQED
2003
IEEE
86views Hardware» more  ISQED 2003»
15 years 12 months ago
Electrical and Thermal Analysis for System-in-a-Package (SiP) Implementation Platform
This paper presents an electrical and thermal performance analysis of System-in-a-Package (SiP) memory/logic implementation platform based on ChipLaminate-Chip (CLC) technology. I...
Michael X. Wang, Katsuharu Suzuki, Wayne Wei-Ming ...
EH
2002
IEEE
97views Hardware» more  EH 2002»
15 years 11 months ago
Coevolution of Form and Function in the Design of Micro Air Vehicles
This paper discusses approaches to cooperative coevolution of form and function for autonomous vehicles, specifically evolving morphology and control for an autonomous micro air v...
Magdalena D. Bugajska, Alan C. Schultz
ICCAD
1996
IEEE
144views Hardware» more  ICCAD 1996»
15 years 10 months ago
Validation coverage analysis for complex digital designs
The functional validation of a state-of-the-art digital design is usually performed by simulation of a register-transfer-level model. The degree to which the testvector suite cove...
Richard C. Ho, Mark Horowitz
ASPDAC
2005
ACM
96views Hardware» more  ASPDAC 2005»
15 years 8 months ago
Oscillation ring based interconnect test scheme for SOC
- We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and cr...
Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, ...