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204
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ISQED
2006
IEEE
16 years 19 days ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
169
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ISQED
2002
IEEE
15 years 11 months ago
2002
IEEE
Critical systems like pace-makers, defibrillators, wearable computers and other electronic gadgets have to be designed not only for reliability but also for ultra-low power consu...
168
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ICCAD
2000
IEEE
15 years 11 months ago
2000
IEEE
— Memory is one of the most important components to be optimized in the several phases of the synthesis process. ioral synthesis, a memory is viewed as an abstract construct whic...
161
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ISLPED
1997
ACM
15 years 10 months ago
1997
ACM
In this paper we present a methodology and techniques for generating cycle-accurate macro-models for RTlevel power analysis. The proposed macro-model predicts not only...
156
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AINA
2006
IEEE
15 years 10 months ago
2006
IEEE
Using beam forming antennas in ad hoc networks have been recently focused on, in order to improve the space reuse. This news context implies to revisit network algorithms because t...