4074 search results - page 538 / 815 » Hardware Modelling and Simulation Using an Object-Oriented M... |
165
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IOLTS
2009
IEEE
16 years 1 months ago
2009
IEEE
The amount of physical variation among electronic components on a die is increasing rapidly. There is a need for a better understanding of variations in transient fault susceptibil...
130
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
An important aspect of Design for Yield for embedded SRAM is identifying the expected worst case behavior in order to guarantee that sufficient design margin is present. Previousl...
141
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DATE
2003
IEEE
15 years 12 months ago
2003
IEEE
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
151
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ASYNC
2002
IEEE
15 years 11 months ago
2002
IEEE
We present a method for synchronizing pausible clocks in GALS (Globally Asynchronous, Locally Synchronous) systems. In contrast to most conventional GALS schemes the method is not...
187
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FMCAD
2008
Springer
15 years 8 months ago
2008
Springer
Post-silicon debug is the problem of determining what's wrong when the fabricated chip of a new design behaves incorrectly. This problem now consumes over half of the overall ...