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ETS
2010
IEEE
150views Hardware» more  ETS 2010»
15 years 5 months ago
Predicting dynamic specifications of ADCs with a low-quality digital input signal
— A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A noisy and nonlinear pulse is applied as the test stimulus, which is suitable for...
Xiaoqin Sheng, Vincent Kerzerho, Hans G. Kerkhoff
JUCS
2007
95views more  JUCS 2007»
15 years 6 months ago
Using Place Invariants and Test Point Placement to Isolate Faults in Discrete Event Systems
: This paper describes a method of using Petri net P-invariants in system diagnosis. To model this process a net oriented fault classification is presented. Hence, the considered d...
Iwan Tabakow
ISPD
2007
ACM
128views Hardware» more  ISPD 2007»
15 years 8 months ago
X-architecture placement based on effective wire models
In this paper, we derive the X-half-perimeter wirelength (XHPWL) model for X-architecture placement and explore the effects of three different wire models on X-architecture plac...
Tung-Chieh Chen, Yi-Lin Chuang, Yao-Wen Chang
ICCAD
2006
IEEE
93views Hardware» more  ICCAD 2006»
16 years 3 months ago
Precise identification of the worst-case voltage drop conditions in power grid verification
– Identifying worst-case voltage drop conditions in every module supplied by the power grid is a crucial problem in modern IC design. In this paper we develop a novel methodology...
Nestoras E. Evmorfopoulos, Dimitris P. Karampatzak...
ICCAD
2001
IEEE
84views Hardware» more  ICCAD 2001»
16 years 3 months ago
On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits
Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don’...
Seiji Kajihara, Kohei Miyase