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DAC
2006
ACM
16 years 7 months ago
Process variation aware OPC with variational lithography modeling
Optical proximity correction (OPC) is one of the most widely used resolution enhancement techniques (RET) in nanometer designs to improve subwavelength printability. Conventional ...
Peng Yu, Sean X. Shi, David Z. Pan
CODES
2003
IEEE
16 years 2 days ago
RTOS scheduling in transaction level models
the level of abstraction in system design promises to enable faster exploration of the design space at early stages. While scheduling decision for embedded software has great impa...
Haobo Yu, Andreas Gerstlauer, Daniel Gajski
ICC
2007
IEEE
16 years 1 months ago
UWB Geo-Regioning Using Multivariate Channel Statistics
Abstract— Ultra-Wideband (UWB) Geo-Regioning is an approach to localize UWB transmitters by means of their channel impulse responses. A received channel impulse response is assig...
Christoph Steiner, Armin Wittneben
GFKL
2005
Springer
95views Data Mining» more  GFKL 2005»
16 years 9 days ago
An Indicator for the Number of Clusters: Using a Linear Map to Simplex Structure
Abstract. The problem of clustering data can be formulated as a graph partitioning problem. In this setting, spectral methods for obtaining optimal solutions have received a lot of...
Marcus Weber, Wasinee Rungsarityotin, Alexander Sc...
IJCNN
2000
IEEE
15 years 11 months ago
Evolving Neural Network Structures Using Axonal Growth Mechanisms
In the eld of arti cial evolution creating methods to evolve neural networks is an important goal. But how to encode the structure and properties of the neural network in the geno...
Peter Eggenberger