We present a general method for automatic reconstruction of accurate, concise, piecewise smooth surface models from scattered range data. The method can be used in a variety of ap...
Hugues Hoppe, Tony DeRose, Tom Duchamp, Mark A. Ha...
Abstract—Modeling parasitic parameters of Through-SiliconVia (TSV) structures is essential in exploring electrical characteristics such as delay and signal integrity (SI) of circ...
Roshan Weerasekera, Matt Grange, Dinesh Pamunuwa, ...
Not considered in the analytical model of the plant, uncertainties always dramatically decrease the performance of the fault detection task in the practice. To cope better with thi...
Abbas Khosravi, Joaquim Armengol Llobet, Esteban R...
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
— We propose the global Arnoldi algorithm for MIMO RLCG interconnect model order reductions. This algorithm is an extension of the standard Arnoldi algorithm for systems with mul...