4074 search results - page 352 / 815 » Hardware Modelling and Simulation Using an Object-Oriented M... |
213
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TSP
2010
15 years 1 months ago
2010
Abstract--In this paper, we investigate various channel estimators that exploit channel sparsity in the time and/or Doppler domain for a multicarrier underwater acoustic system. We...
157
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TCBB
2008
15 years 6 months ago
2008
Emerging microarray technologies allow affordable typing of very long genome sequences. A key challenge in analyzing of such huge amount of data is scalable and accurate computatio...
169
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CARDIS
2004
Springer
16 years 4 days ago
2004
Springer
CMOS gates consume different amounts of power whether their output has a falling or a rising edge. Therefore the overall power consumption of a CMOS circuit leaks information about...
191
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ISQED
2011
IEEE
14 years 10 months ago
2011
IEEE
With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
163
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...