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162
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ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
— With process variation becoming a growing concern in deep submicron technologies, the ability to efficiently obtain an accurate estimate of failure probability of SRAM compone...
165
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ICCAD
2000
IEEE
15 years 10 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
146
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DATE
2000
IEEE
15 years 10 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
162
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ISCAS
1999
IEEE
15 years 10 months ago
1999
IEEE
A method for modeling complex CMOS gates by the reduction of each gate to an effective equivalent inverter is introduced. The conducting and parasitic behavior of parallel and ser...
158
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CN
1998
15 years 6 months ago
1998
The main aim of our work is to create a realistic model of the behaviour of the upper airways during laryngoscopy. In this procedure the anaesthetist uses a rigid blade to displac...