Abstract--The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer-circuit design. High voltages that resulted from ESD might cause high cu...
Finding, counting and/or listing triangles (three vertices with three edges) in massive graphs are natural fundamental problems, which received recently much attention because of ...
Let V be a set of points in a d-dimensional lp-metric space. Let s, t ∈ V and let L be any real number. An L-bounded leg path from s to t is an ordered set of points which conne...
We propose in this paper a face authentication method based on a similarity measure. The SIFT descriptor is used to define some interest keypoints characterized by an invariant pa...
In this paper, we deal with the problem of performing what-if analysis for changes that occur in the schema/structure of the data warehouse We abstract software modules, queries, r...
George Papastefanatos, Panos Vassiliadis, Alkis Si...