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SIGGRAPH
2010
ACM
15 years 10 months ago
Effects of global illumination approximations on material appearance
Jaroslav Krivánek, James A. Ferwerda, Kavita Bala
IWVF
2001
Springer
15 years 10 months ago
Global Topological Properties of Images Derived from Local Curvature Features
Erhardt Barth, Mario Ferraro, Christoph Zetzsche
IWVF
2001
Springer
15 years 10 months ago
Integration of Local and Global Shape Analysis for Logo Classification
Jan Neumann, Hanan Samet, Aya Soffer
DCC
1997
IEEE
15 years 10 months ago
Capturing Global Redundancy to Improve Compression of Large Images
Barbara L. Kess, Stephen E. Reichenbach