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ASAP
2005
IEEE
165views Hardware» more  ASAP 2005»
15 years 11 months ago
CONAN - A Design Exploration Framework for Reliable Nano-Electronics
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...
ECAI
2004
Springer
15 years 11 months ago
High-Level Observations in Java Debugging
Recent years have seen considerable developments in modeling techniques for automatic fault location in programs. However, much of this research considered the models from a standa...
Wolfgang Mayer, Markus Stumptner
IPPS
2003
IEEE
15 years 11 months ago
Evolutionary Fault Recovery in a Virtex FPGA Using a Representation that Incorporates Routing
Most evolutionary approaches to fault recovery in FPGAs focus on evolving alternative logic configurations as opposed to evolving the intra-cell routing. Since the majority of tra...
Jason D. Lohn, Gregory V. Larchev, Ronald F. DeMar...
ISQED
2002
IEEE
203views Hardware» more  ISQED 2002»
15 years 11 months ago
Automatic Test Program Generation from RT-Level Microprocessor Descriptions
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
IPPS
2006
IEEE
15 years 12 months ago
Parallel genetic algorithm for SPICE model parameter extraction
Models of simulation program with integrated circuit emphasis (SPICE) are currently playing a central role in the connection between circuit design and chip fabrication communitie...
Yiming Li, Yen-Yu Cho