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METRICS
2003
IEEE
15 years 12 months ago
When Can We Test Less?
When it is impractical to rigorously assess all parts of complex systems, test engineers use defect detectors to focus their limited resources. In this article, we define some pr...
Tim Menzies, Justin S. Di Stefano, Kareem Ammar, K...
ICCAD
1998
IEEE
96views Hardware» more  ICCAD 1998»
15 years 11 months ago
Test set compaction algorithms for combinational circuits
This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...
Ilker Hamzaoglu, Janak H. Patel
SC
1990
ACM
15 years 10 months ago
Loop distribution with arbitrary control flow
Loop distribution is an integral part of transforming a sequential program into a parallel one. It is used extensively in parallelization,vectorization, and memory management. For...
Ken Kennedy, Kathryn S. McKinley
DLT
2003
15 years 8 months ago
Tile Rewriting Grammars
Past proposals for applying to pictures or 2D languages the generative grammar approach do not match in our opinion the elegance and descriptive adequacy that made Context Free gr...
Stefano Crespi-Reghizzi, Matteo Pradella
COLING
2002
15 years 6 months ago
The Computation of Word Associations: Comparing Syntagmatic and Paradigmatic Approaches
It is shown that basic language processes such as the production of free word associations and the generation of synonyms can be simulated using statistical models that analyze th...
Reinhard Rapp