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ISCAS
1999
IEEE
106views Hardware» more  ISCAS 1999»
15 years 11 months ago
Test pattern generation for width compression in BIST
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Paulo F. Flores, Horácio C. Neto, K. Chakra...
ICS
1998
Tsinghua U.
15 years 11 months ago
Techniques for Empirical Testing of Parallel Random Number Generators
Parallel computers are now commonly used for computational science and engineering, and many applications in these areas use random number generators. For some applications, such ...
Paul D. Coddington, Sung Hoon Ko
DSL
2009
15 years 4 months ago
Operator Language: A Program Generation Framework for Fast Kernels
Abstract. We present the Operator Language (OL), a framework to automatically generate fast numerical kernels. OL provides the structure to extend the program generation system Spi...
Franz Franchetti, Frédéric de Mesmay...
ICPP
2008
IEEE
16 years 1 months ago
On the Design of Fast Pseudo-Random Number Generators for the Cell Broadband Engine and an Application to Risk Analysis
Numerical simulations in computational physics, biology, and finance, often require the use of high quality and efficient parallel random number generators. We design and optimi...
David A. Bader, Aparna Chandramowlishwaran, Virat ...
FPL
2005
Springer
139views Hardware» more  FPL 2005»
16 years 8 days ago
Mullet - A Parallel Multiplier Generator
A module generator called Mullet for producing near-optimal parallel multipliers in a technology independent manner is presented. Using this tool, a large number of candidate desi...
Kuen Hung Tsoi, Philip Heng Wai Leong