We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
Finding knowledge from vast quantities of data is a difficult task, made simpler by visually representing this information. The Internet can be considered a vast (global) database,...
We present a novel technique CLIP for optimizing both the height and width of CMOS cell layouts in the two-dimensional (2D) style. CLIP is based on integer-linear programming (ILP...
The problem of finding the binomial population with the highest success probability is considered when the number of binomial populations is large. A new rigorous indifference zo...
To successfully prepare and model data, the data miner needs to be aware of the properties of the data manifold. In this chapter, the outline of a tool for automatically generating...