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DATE
2000
IEEE
121views Hardware» more  DATE 2000»
15 years 11 months ago
Functional Test Generation for Full Scan Circuits
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
Irith Pomeranz, Sudhakar M. Reddy
HPCN
1999
Springer
15 years 11 months ago
VisualExpresso: Generating a Virtual Reality Internet
Finding knowledge from vast quantities of data is a difficult task, made simpler by visually representing this information. The Internet can be considered a vast (global) database,...
David Cleary, Diarmuid O'Donoghue
DAC
1997
ACM
15 years 10 months ago
CLIP: An Optimizing Layout Generator for Two-Dimensional CMOS Cells
We present a novel technique CLIP for optimizing both the height and width of CMOS cell layouts in the two-dimensional (2D) style. CLIP is based on integer-linear programming (ILP...
Avaneendra Gupta, John P. Hayes
WSC
2007
15 years 9 months ago
Subset selection and optimization for selecting binomial systems applied to supersaturated design generation
The problem of finding the binomial population with the highest success probability is considered when the number of binomial populations is large. A new rigorous indifference zo...
Ning Zheng, Theodore Allen
HIS
2001
15 years 8 months ago
An Automated Report Generation Tool for the Data Understanding Phase
To successfully prepare and model data, the data miner needs to be aware of the properties of the data manifold. In this chapter, the outline of a tool for automatically generating...
Juha Vesanto, Jaakko Hollmén