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DATE
2009
IEEE
90views Hardware» more  DATE 2009»
16 years 18 days ago
A scalable method for the generation of small test sets
This paper presents a scalable method to generate close to minimal size test pattern sets for stuck-at faults in scan based circuits. The method creates sets of potentially compat...
Santiago Remersaro, Janusz Rajski, Sudhakar M. Red...
ICRA
2005
IEEE
155views Robotics» more  ICRA 2005»
15 years 11 months ago
CPG Design using Inhibitory Networks
– We describe in detail the behavior of an inhibitory Central Pattern Generator (CPG) network for robot control. A four-neuron, mutual inhibitory network forms the basic coordina...
M. Anthony Lewis, Francesco Tenore, Ralph Etienne-...
ET
2000
145views more  ET 2000»
15 years 5 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar
BIOADIT
2004
Springer
15 years 11 months ago
Distributed Central Pattern Generator Model for Robotics Application Based on Phase Sensitivity Analysis
Abstract. A method is presented to predict phase relationships between coupled phase oscillators. As an illustration of how the method can be applied, a distributed Central Pattern...
Jonas Buchli, Auke Jan Ijspeert
SERP
2007
15 years 7 months ago
From Functional Requirements through Test Evaluation Design to Automatic Test Data Patterns Retrieval - a Concept for Testing of
- Functional testing of software dedicated for hybrid embedded systems should start at the early development phase and requires analysis of discrete and continuous signals, where t...
Justyna Zander-Nowicka, Abel Marrero Pérez,...