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ITC
2000
IEEE
53views Hardware» more  ITC 2000»
15 years 10 months ago
Using on-chip test pattern compression for full scan SoC designs
Helmut Lang, Jens Pfeiffer, Jeff Maguire
SAC
1999
ACM
15 years 10 months ago
Multithreaded Rendezvous: A Design Pattern for Distributed Rendezvous
Ricardo Jiménez-Peris, Marta Patiño-...