38 search results - page 2 / 8 » Generation of Synthetic Sequential Benchmark Circuits |
145
click to vote
ICCAD
2000
IEEE
15 years 10 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
166
Voted
DATE
1999
IEEE
15 years 10 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
178
Voted
ISLPED
1997
ACM
15 years 9 months ago
1997
ACM
A new statistical technique for average power estimation in sequential circuits is presented. Due to the feedback mechanism, conventional statistical procedures cannot be applied ...
164
Voted
TSMC
2010
15 years 15 days ago
2010
Abstract--It is critical to use automated generators for synthetic models and data, given the sparsity of benchmark models for empirical analysis and the cost of generating models ...
143
click to vote
AAAI
2008
15 years 8 months ago
2008
Automated generators for synthetic models and data can play a crucial role in designing new algorithms/modelframeworks, given the sparsity of benchmark models for empirical analys...