6894 search results - page 159 / 1379 » Generation Problems |
184
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AMOST
2007
ACM
15 years 10 months ago
2007
ACM
Model-checkers have recently been suggested for automated software test-case generation. Several works have presented methods that create efficient test-suites using model-checker...
145
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...
180
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EPIA
2009
Springer
16 years 1 months ago
2009
Springer
Abstract. In this paper, we describe a novel approach to tackle intention recognition, by combining dynamically configurable and situation-sensitive Causal Bayes Networks plus pla...
135
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CEC
2007
IEEE
16 years 24 days ago
2007
IEEE
— Recent large scale experiments have shown that the Normalized Information Distance, an algorithmic information measure, is among the best similarity metrics for melody classi...
166
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BIRTHDAY
2005
Springer
16 years 7 hour ago
2005
Springer
Constructing a program from a specification is a long-known general and fundamental problem. Besides its theoretical interest, this question also has practical implications, since...