6894 search results - page 1086 / 1379 » Generation Problems |
197
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DATE
2010
IEEE
15 years 11 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
134
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DATE
2002
IEEE
15 years 11 months ago
2002
IEEE
The relative tolerances for interconnect and device parameter variations have not scaled with feature sizes which have brought about significant performance variability. As we sca...
183
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ICDM
2002
IEEE
15 years 11 months ago
2002
IEEE
This paper describes a novel data mining approach that employs evolutionary programming to discover knowledge represented in Bayesian networks. There are two different approaches ...
193
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ICNP
2002
IEEE
15 years 11 months ago
2002
IEEE
This paper presents a new algorithm for dynamic routing of bandwidth guaranteed multicast tunnels with failure backup. The multicast routing problem arises in many contexts such a...
193
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ICPADS
2002
IEEE
15 years 11 months ago
2002
IEEE
Network emulation systems are widely used to explore the behavior of network protocols and to test and evaluate protocol implementations and applications. The major problem of net...