6894 search results - page 1023 / 1379 » Generation Problems |
184
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ALT
2001
Springer
16 years 3 months ago
2001
Springer
This paper concerns the design of a Support Vector Machine (SVM) appropriate for the learning of Boolean functions. This is motivated by the need of a more sophisticated algorithm ...
169
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ICCD
2004
IEEE
16 years 3 months ago
2004
IEEE
Leakage current is a key factor in IC power consumption even in the active operating mode. We investigate the simultaneous optimization of gate size and threshold voltage to reduc...
167
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ICCD
2002
IEEE
16 years 3 months ago
2002
IEEE
A variety of factors is making it increasingly difficult and expensive to design and manufacture traditional Application Specific Integrated Circuits (ASICs). This has started a s...
153
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ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
—The microprocessor verification challenge becomes higher in the on-chip bus (OCB) than in the unit-level. Especially for the external interrupts, since they interface with othe...
158
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ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
In double patterning lithography (DPL) layout decomposition for 45nm and below process nodes, two features must be assigned opposite colors (corresponding to different exposures)...