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ICSE
2009
IEEE-ACM
16 years 1 months ago
WISE: Automated test generation for worst-case complexity
Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to ...
Jacob Burnim, Sudeep Juvekar, Koushik Sen
CSDA
2008
86views more  CSDA 2008»
15 years 6 months ago
Transformations for semi-continuous data
Semi-continuous data arise in many applications where naturally-continuous data become contaminated by the data generating mechanism. The resulting data contain several values tha...
Galit Shmueli, Wolfgang Jank, Valerie Hyde
CVPR
2003
IEEE
16 years 8 months ago
Learning Bayesian Network Classifiers for Facial Expression Recognition using both Labeled and Unlabeled Data
Understanding human emotions is one of the necessary skills for the computer to interact intelligently with human users. The most expressive way humans display emotions is through...
Ira Cohen, Nicu Sebe, Fabio Gagliardi Cozman, Marc...
ISSRE
2000
IEEE
15 years 11 months ago
Evaluation of Regressive Methods for Automated Generation of Test Trajectories
Automated generation of test cases is a prerequisite for fast testing. Whereas the research has addressed the creation of individual test points, test trajectoiy generation has at...
Brian J. Taylor, Bojan Cukic
EACL
2010
ACL Anthology
15 years 4 months ago
Generating Referring Expressions in Context: The GREC Task Evaluation Challenges
Until recently, referring expression generation (reg) research focused on the task of selecting the semantic content of definite mentions of listener-familiar discourse entities. I...
Anja Belz, Eric Kow, Jette Viethen, Albert Gatt