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DATE
2010
IEEE
171views Hardware» more  DATE 2010»
16 years 1 days ago
Digital statistical analysis using VHDL
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
Manfred Dietrich, Uwe Eichler, Joachim Haase
ACL
2007
15 years 8 months ago
A fully Bayesian approach to unsupervised part-of-speech tagging
Unsupervised learning of linguistic structure is a difficult problem. A common approach is to define a generative model and maximize the probability of the hidden structure give...
Sharon Goldwater, Tom Griffiths
ECAI
2010
Springer
15 years 8 months ago
A Fault-model-based Debugging Aid for Data Warehouse Applications
The paper describes a model-based approach to developing a general tool for localizing faults in applications of data warehouse technology. A model of the application is configured...
Peter Struss, Vikas Shivashankar, Mohamed Zahoor
ICML
2010
IEEE
15 years 8 months ago
Bayesian Multi-Task Reinforcement Learning
We consider the problem of multi-task reinforcement learning where the learner is provided with a set of tasks, for which only a small number of samples can be generated for any g...
Alessandro Lazaric, Mohammad Ghavamzadeh
ARTMED
2005
109views more  ARTMED 2005»
15 years 6 months ago
Customization in a unified framework for summarizing medical literature
Objectives: We present the summarization system in the PERSIVAL medical digital library. Although we discuss the context of our summarization research within the PERSIVAL platform...
Noemie Elhadad, Min-Yen Kan, Judith L. Klavans, Ka...