27827 search results - page 320 / 5566 » Generating |
172
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ICCD
1996
IEEE
15 years 10 months ago
1996
IEEE
In general, automatic layout composition techniques based on pre-designed devices facilitate the production of small IC numbers by prefabricating their basic structures. They also...
159
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DAC
1994
ACM
15 years 10 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
177
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ITC
1992
IEEE
15 years 10 months ago
1992
IEEE
In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. t...
138
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SIGCOMM
1990
ACM
15 years 10 months ago
1990
ACM
The current generation of protocol architectures, such as TCP/IP or the IS0 suite, seem successful at meeting the demands of todays networks. However, a number of new requirements...
146
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ITP
2010
15 years 10 months ago
2010
Nitpick is a counterexample generator for Isabelle/HOL that builds on Kodkod, a SAT-based first-order relational model finder. Nitpick supports unbounded quantification, (co)ind...