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ICCD
2006
IEEE
84views Hardware» more  ICCD 2006»
16 years 3 months ago
Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation
—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...
Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Y...
WISTP
2010
Springer
16 years 1 months ago
Security Analysis of Mobile Phones Used as OTP Generators
Abstract. The Norwegian company Encap has developed protocols enabling individuals to use their mobile phones as one-time password (OTP) generators. An initial analysis of the prot...
Håvard Raddum, Lars Hopland Nestås, Kj...
FLOPS
2010
Springer
16 years 1 months ago
Applying Constraint Logic Programming to SQL Test Case Generation
We present a general framework for generating SQL query test cases using Constraint Logic Programming. Given a database schema and a SQL view defined in terms of other views and s...
Rafael Caballero, Yolanda García-Ruiz, Fern...
FLOPS
2010
Springer
16 years 1 months ago
Code Generation via Higher-Order Rewrite Systems
Abstract. We present the meta-theory behind the code generation facilities of Isabelle/HOL. To bridge the gap between the source (higherorder logic with type classes) and the many ...
Florian Haftmann, Tobias Nipkow
STACS
2009
Springer
16 years 1 months ago
Generating Shorter Bases for Hard Random Lattices
We revisit the problem of generating a “hard” random lattice together with a basis of relatively short vectors. This problem has gained in importance lately due to new cryptogr...
Joël Alwen, Chris Peikert