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ICTAC
2004
Springer
15 years 11 months ago
Combining Algebraic and Model-Based Test Case Generation
Abstract. The classical work on test case generation and formal methods focuses either on algebraic or model-based specifications. In this paper we propose an approach to derive t...
Li Dan, Bernhard K. Aichernig
MFCS
2004
Springer
15 years 11 months ago
Generation Problems
Given a fixed computable binary operation , we study the complexity of the following generation problem: The input consists of strings ½ Ò . The question is whether is in the c...
Elmar Böhler, Christian Glaßer, Bernhar...
MTDT
2003
IEEE
105views Hardware» more  MTDT 2003»
15 years 11 months ago
A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories
Memory cores (especially SRAM cores) used on a system chip usually come from a memory compiler. Commercial memory compilers have their limitation— a large memory may need to be ...
Rei-Fu Huang, Li-Ming Denq, Cheng-Wen Wu, Jin-Fu L...
DATE
2010
IEEE
156views Hardware» more  DATE 2010»
15 years 11 months ago
Domain specific architecture for next generation wireless communication
—In order to solve the challenges in processor design for the next generation wireless communication systems, this paper first proposes a system level design flow for communicati...
Botao Zhang, Hengzhu Liu, Heng Zhao, Fangzheng Mo,...
KBSE
2002
IEEE
15 years 11 months ago
Generative Design Patterns
A design pattern encapsulates the knowledge of object-oriented designers into re-usable artifacts. A design pattern is a descriptive device that fosters software design re-use. Th...
Steve MacDonald, Duane Szafron, Jonathan Schaeffer...