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DAC
2009
ACM
16 years 7 months ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
DAC
2009
ACM
16 years 7 months ago
Spectral techniques for high-resolution thermal characterization with limited sensor data
Elevated chip temperatures are true limiters to the scalability of computing systems. Excessive runtime thermal variations compromise the performance and reliability of integrated...
Ryan Cochran, Sherief Reda
DAC
2009
ACM
16 years 7 months ago
Process variation characterization of chip-level multiprocessors
Within-die variation in leakage power consumption is substantial and increasing for chip-level multiprocessors (CMPs) and multiprocessor systems-on-chip. Dealing with this problem...
Lide Zhang, Lan S. Bai, Robert P. Dick, Li Shang, ...
DAC
2008
ACM
16 years 7 months ago
ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction
In this paper, we present ELIAD, an efficient lithography aware detailed router to optimize silicon image after optical proximity correction (OPC) in a correct-by-construction man...
Minsik Cho, Kun Yuan, Yongchan Ban, David Z. Pan
DAC
2008
ACM
16 years 7 months ago
Type-matching clock tree for zero skew clock gating
Clock skew minimization is always very important in the clock tree synthesis. Due to clock gating, the clock tree may include different types of logic gates, e.g., AND gates, OR g...
Chia-Ming Chang, Shih-Hsu Huang, Yuan-Kai Ho, Jia-...
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