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ICCAD
2001
IEEE
84views Hardware» more  ICCAD 2001»
16 years 3 months ago
On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits
Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don’...
Seiji Kajihara, Kohei Miyase
PEPM
2010
ACM
16 years 3 months ago
Making "stricterness" more relevant
Adapting a strictness analyser to have it take into account explicit strictness annotations can be a tricky business. Straightforward extensions of analyses based on relevance typ...
Stefan Holdermans, Jurriaan Hage
SAC
2010
ACM
16 years 1 months ago
Dual analysis for proving safety and finding bugs
Program bugs remain a major challenge for software developers and various tools have been proposed to help with their localization and elimination. Most present-day tools are base...
Corneliu Popeea, Wei-Ngan Chin
ICAC
2009
IEEE
16 years 1 months ago
Applying adaptation design patterns
Dynamic adaptation may be used to prevent software downtime while new requirements and responses to environmental conditions are incorporated into the system. Previously, we studi...
Andres J. Ramirez, Betty H. C. Cheng
ISLPED
2009
ACM
118views Hardware» more  ISLPED 2009»
16 years 1 months ago
Serial sub-threshold circuits for ultra-low-power systems
This paper explores the use of serial circuits for ultra-low-power sub-threshold systems. A serial system leads to a smaller design and higher utilization, yielding 40% active ene...
Sudhanshu Khanna, Benton H. Calhoun