2997 search results - page 395 / 600 » Fuzzy robustness analysis |
156
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ICCAD
1996
IEEE
15 years 10 months ago
1996
IEEE
In this paper, we propose a method to generate high quality test waveform on chip to avoid the parasitic eects in an analog testability bus test environment. For the test response...
145
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ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
We present a robust, automated oscillator macromodeling technique for extracting comprehensive phase and amplitude macromodels from oscillators' SPICE circuit descriptions. Th...
181
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AUSAI
2007
Springer
15 years 10 months ago
2007
Springer
Many real-world problems are over-constrained and require search techniques adapted to optimising cost functions rather than searching for consistency. This makes the MAX-SAT probl...
191
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VLSID
2010
IEEE
15 years 10 months ago
2010
IEEE
A novel design approach for simultaneous power and stability (static noise margin, SNM) optimization of nanoCMOS static random access memory (SRAM) is presented. A 45nm single-end...
173
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APCCAS
2006
IEEE
15 years 10 months ago
2006
IEEE
A new low offset dynamic comparator for high resolution high speed analog-to-digital application has been designed. Inputs are reconfigured from the typical differential pair compa...