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DAC
2007
ACM
16 years 7 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2002
ACM
16 years 7 months ago
Scheduler-based DRAM energy management
Previous work on DRAM power-mode management focused on hardware-based techniques and compiler-directed schemes to explicitly transition unused memory modules to low-power operatin...
Victor Delaluz, Anand Sivasubramaniam, Mahmut T. K...
ICCAD
2005
IEEE
147views Hardware» more  ICCAD 2005»
16 years 2 months ago
NoCEE: energy macro-model extraction methodology for network on chip routers
In this paper we present NoCEE, a fast and accurate method for extracting energy models for packet-switched Network on Chip (NoC) routers. Linear regression is used to model the r...
Jeremy Chan, Sri Parameswaran
ISORC
2009
IEEE
16 years 21 days ago
Component Based Middleware-Synthesis for AUTOSAR Basic Software
Distributed real-time automotive embedded systems have to be highly dependable as well as cost-efficient due to the large number of manufactured units. To close the gap between r...
Dietmar Schreiner, Markus Schordan, Karl M. Gö...
IMC
2009
ACM
16 years 17 days ago
IXPs: mapped?
Internet exchange points (IXPs) are an important ingredient of the Internet AS-level ecosystem—a logical fabric of the Internet made up of about 30,000 ASes and their mutual bus...
Brice Augustin, Balachander Krishnamurthy, Walter ...