The testing time for a system-on-chip (SOC) is determined to a large extent by the design of test wrappers and the test access mechanism (TAM). Wrapper/TAM co-optimization is ther...
Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan M...
In this paper we study the scenario in which a server sends dynamic data over a single broadcast channel to a number of passive clients. We consider the data to consist of discret...
Michael Langberg, Alexander Sprintson, Jehoshua Br...
Three modular reduction algorithms for large integers are compared with respect to their performance in portable software: the classical algorithm, Barrett’s algorithm and Montgo...
The spatial distribution and time course of electrical signals in neurons have important theoretical and practical consequences. Because it is difficult to infer how neuronal form...
Nicholas T. Carnevale, Kenneth Y. Tsai, Brenda J. ...
Abstract--This paper gives a reliability sampling plan for progressively type I interval censored life tests when the lifetime follows the exponential distribution. We use the maxi...