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» Functional Scan Chain Testing

146

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ICCD
2006
IEEE

116views Hardware» more ICCD 2006»

RTL Scan Design for Skewed-Load At-speed Test under Power Constraints

16 years 2 months ago

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This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...

Ho Fai Ko, Nicola Nicolici

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139

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ICCAD
1993
IEEE

77views Hardware» more ICCAD 1993»

Reconfigurable scan chains: a novel approach to reduce test application time

15 years 10 months ago

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Sridhar Narayanan, Melvin A. Breuer

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118

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ICCAD
1992
IEEE

96views Hardware» more ICCAD 1992»

Configuring multiple scan chains for minimum test time

15 years 10 months ago

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Sridhar Narayanan, Rajesh Gupta, Melvin A. Breuer

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119

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ATS
2001
IEEE

70views Hardware» more ATS 2001»

Test Scheduling and Scan-Chain Division under Power Constraint

15 years 9 months ago

Download www.ida.liu.se

Erik Larsson, Zebo Peng

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106

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TODAES
2008

42views more TODAES 2008»

Layout-aware scan chain reorder for launch-off-shift transition test coverage

15 years 5 months ago

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