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ECCV
2008
Springer
16 years 8 months ago
Passive Reflectometry
Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for measuring reflectance are cumbersome, however, and although...
Fabiano Romeiro, Yuriy Vasilyev, Todd Zickler
ECCV
1996
Springer
16 years 8 months ago
Dense Depth Map Reconstruction: A Minimization and Regularization Approach which Preserves Discontinuities
We present a variational approachto dense stereo reconstructionwhich combines powerful tools such as regularization and multi-scale processing to estimate directly depth from a num...
Luc Robert, Rachid Deriche
ICIP
2006
IEEE
16 years 8 months ago
Light and Fast Statistical Motion Detection Method Based on Ergodic Model
In this paper, we propose a light and fast pixel-based statistical motion detection method based on a background subtraction procedure. The statistical representation of the backg...
Pierre-Marc Jodoin, Max Mignotte, Janusz Konrad
ICIP
2006
IEEE
16 years 8 months ago
Low-Rate Reduced Complexity Image Compression using Directionlets
The standard separable two-dimensional (2-D) wavelet transform (WT) has recently achieved a great success in image processing because it provides a sparse representation of smooth...
Vladan Velisavljevic, Baltasar Beferull-Lozano, Ma...
ICIP
2005
IEEE
16 years 8 months ago
Sampling in practice: is the best reconstruction space bandlimited?
Shannon's sampling theory and its variants provide effective solutions to the problem of reconstructing a signal from its samples in some "shift-invariant " space, ...
Sathish Ramani, Dimitri Van De Ville, Michael Unse...