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VTS
1999
IEEE
66views Hardware» more  VTS 1999»
15 years 10 months ago
A New Bare Die Test Methodology
1 While multichip module technology has been developed for high performance IC applications, the technology is not widely adopted due to economical reasons. One of the reasons that...
Zao Yang, K.-T. Cheng, K. L. Tai
TCAD
2002
134views more  TCAD 2002»
15 years 5 months ago
Testing and diagnosis of interconnect faults in cluster-based FPGA architectures
As IC densities are increasing, cluster-based FPGA architectures are becoming the architecture of choice for major FPGA manufacturers. A cluster-based architecture is one in which...
Ian G. Harris, Russell Tessier
FLAIRS
2009
15 years 4 months ago
Unit Testing for Qualitative Spatial and Temporal Reasoning
Researchers in commonsense, qualitative spatial and temporal reasoning (QSTR) provide flexible and intuitive methods for reasoning about vague and uncertain information including ...
Carl P. L. Schultz, Robert Amor, Hans W. Guesgen
VISUALIZATION
2003
IEEE
15 years 11 months ago
Visualizing Industrial CT Volume Data for Nondestructive Testing Applications
This paper describes a set of techniques developed for the visualization of high-resolution volume data generated from industrial computed tomography for nondestructive testing (N...
Runzhen Huang, Kwan-Liu Ma, Patrick S. McCormick, ...
DAWAK
2003
Springer
15 years 11 months ago
Performance Tests in Data Warehousing ETLM Process for Detection of Changes in Data Origin
In a data warehouse (DW) environment, when the operational environment does not posses or does not want to inform the data about the changes that occurred, controls have to be impl...
Rosana L. de B. A. Rocha, Leonardo Figueiredo Card...