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ICES
2010
Springer
106views Hardware» more  ICES 2010»
15 years 4 months ago
The Use of Genetic Algorithm to Reduce Power Consumption during Test Application
Abstract. In this paper it is demonstrated how two issues from the area of testing electronic components can be merged and solved by means of a genetic algorithm. The two issues ar...
Jaroslav Skarvada, Zdenek Kotásek, Josef St...
FLAIRS
2009
15 years 3 months ago
Advanced Measures for Empirical Testing
Empirical testing is a very popular evaluation method for the development of intelligent systems. Here, previously solved problems with correct solutions are given as cases to the...
Joachim Baumeister
GG
2004
Springer
15 years 11 months ago
Generating Test Cases for Code Generators by Unfolding Graph Transformation Systems
Abstract. Code generators are widely used in the development of embedded software to automatically generate executable code from graphical specifications. However, at present, cod...
Paolo Baldan, Barbara König, Ingo Stürme...
DAC
1994
ACM
15 years 10 months ago
Functional Test Generation for FSMs by Fault Extraction
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
Bapiraju Vinnakota, Jason Andrews
JOT
2010
173views more  JOT 2010»
15 years 4 months ago
A Dependence Representation for Coverage Testing of Object-Oriented Programs
Abstract We propose a dependence-based representation for object-oriented programs, named Call-based Object-Oriented System Dependence Graph (COSDG). Apart from structural features...
E. S. F. Najumudheen, Rajib Mall, Debasis Samanta