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TASE
2011
IEEE
15 years 1 months ago
Multiclass Flow Line Models of Semiconductor Manufacturing Equipment for Fab-Level Simulation
—For multiclass flow line models, we identify a class of service times that allow a decomposition of the system into subsets of servers called channels. In each channel, the cus...
James R. Morrison
DAC
2007
ACM
16 years 7 months ago
Automatic Verification of External Interrupt Behaviors for Microprocessor Design
Interrupt behaviors, especially the external ones, are difficult to verify in a microprocessor design project in that they involve both interacting hardware and software. This pap...
Fu-Ching Yang, Wen-Kai Huang, Ing-Jer Huang
EUROSYS
2006
ACM
16 years 3 months ago
Using queries for distributed monitoring and forensics
Distributed systems are hard to build, profile, debug, and test. Monitoring a distributed system – to detect and analyze bugs, test for regressions, identify fault-tolerance pr...
Atul Singh, Petros Maniatis, Timothy Roscoe, Peter...
ICCAD
2003
IEEE
175views Hardware» more  ICCAD 2003»
16 years 3 months ago
Path Delay Estimation using Power Supply Transient Signals: A Comparative Study using Fourier and Wavelet Analysis
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
Abhishek Singh, Jitin Tharian, Jim Plusquellic
CVPR
2010
IEEE
16 years 2 months ago
The chains model for detecting parts by their context
Detecting an object part relies on two sources of information - the appearance of the part itself, and the context supplied by surrounding parts. In this paper we consider problem...
Leonid Karlinsky, Michael Dinerstein, Daniel Harar...