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Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
269
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POPL
2002
ACM
16 years 6 months ago
2002
ACM
e Abstraction for Software Verification Cormac Flanagan Shaz Qadeer Compaq Systems Research Center 130 Lytton Ave, Palo Alto, CA 94301 Software verification is an important and di...
169
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ICCV
2001
IEEE
16 years 8 months ago
2001
IEEE
This paper presents a novel modeling algorithm that is capable of simultaneously recovering correct shape geometry as well as its unknown topology from arbitrarily complicated dat...
162
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SIGSOFT
2009
ACM
16 years 7 months ago
2009
ACM
The trend towards processors with more and more parallel cores is increasing the need for software that can take advantage of parallelism. The most widespread method for writing p...
165
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ISSTA
2009
ACM
16 years 21 days ago
2009
ACM
Dynamic test generation consists of executing a program while gathering symbolic constraints on inputs from predicates encountered in branch statements, and of using a constraint ...