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IOLTS
2005
IEEE
163views Hardware» more  IOLTS 2005»
16 years 12 days ago
Modeling Soft-Error Susceptibility for IP Blocks
As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These “soft errors” can be a nuisance or catastro...
Robert C. Aitken, Betina Hold
KBSE
2005
IEEE
16 years 12 days ago
Automated test generation for engineering applications
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
Songtao Xia, Ben Di Vito, César Muño...
181
Voted
ICML
1999
IEEE
15 years 11 months ago
Learning Hierarchical Performance Knowledge by Observation
Developing automated agents that intelligently perform complex real world tasks is time consuming and expensive. The most expensive part of developing these intelligent task perfo...
Michael van Lent, John E. Laird
VLSID
2007
IEEE
154views VLSI» more  VLSID 2007»
16 years 7 months ago
Model Based Test Generation for Microprocessor Architecture Validation
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
Sreekumar V. Kodakara, Deepak Mathaikutty, Ajit Di...
ATAL
2008
Springer
15 years 8 months ago
Norm emergence under constrained interactions in diverse societies
Effective norms, emerging from sustained individual interactions over time, can complement societal rules and significantly enhance performance of individual agents and agent soci...
Partha Mukherjee, Sandip Sen, Stéphane Airi...
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