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VTS
2008
IEEE
70views Hardware» more  VTS 2008»
16 years 28 days ago
A Statistical Approach to Characterizing and Testing Functionalized Nanowires
Unlike the top-down photolithographic CMOS VLSI process, cost-effective bulk fabrication of nanodevices calls for a bottom-up approach, generally called self-assembly. Selfassembl...
James Dardig, Haralampos-G. D. Stratigopoulos, Eri...
CIDM
2007
IEEE
16 years 27 days ago
Data Mining of MISR Aerosol Product using Spatial Statistics
— In climate models, aerosol forcing is the major source of uncertainty in climate forcing, over the industrial period. To reduce this uncertainty, instruments on satellites have...
Tao Shi, Noel Cressie
HICSS
2007
IEEE
174views Biometrics» more  HICSS 2007»
16 years 27 days ago
A Comparison of Statistical Approaches for Genetic Anticipation with Application to Pancreatic Cancer
Genetic anticipation for a particular disease can involve an earlier age at onset (or, diagnosis), greater severity, and/or a higher number of affected individuals in successive g...
Gleb R. Haynatzki, Randall E. Brand, Vera R. Hayna...
IPPS
2007
IEEE
16 years 26 days ago
Security Threat Prediction in a Local Area Network Using Statistical Model
In today’s large and complex network scenario vulnerability scanners play a major role from security perspective by proactively identifying the known security problems or vulner...
Somak Bhattacharya, S. K. Ghosh
ISBI
2007
IEEE
16 years 25 days ago
Statistical Shape Analysis via Principal Factor Analysis
Statistical shape analysis techniques commonly employed in the medical imaging community, such as Active Shape Models or Active Appearance Models, rely on Principal Component Anal...
Mauricio Reyes, Marius George Linguraru, Kostas Ma...