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ICCAD
2005
IEEE
176views Hardware» more  ICCAD 2005»
16 years 3 months ago
Statistical gate sizing for timing yield optimization
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
Debjit Sinha, Narendra V. Shenoy, Hai Zhou
CLUSTER
2009
IEEE
15 years 11 months ago
Numerically stable, single-pass, parallel statistics algorithms
—Statistical analysis is widely used for countless scientific applications in order to analyze and infer meaning from data. A key challenge of any statistical analysis package a...
Janine Bennett, R. Grout, Philippe P. Pébay...
ISLPED
1996
ACM
110views Hardware» more  ISLPED 1996»
15 years 10 months ago
Statistical estimation of average power dissipation in CMOS VLSI circuits using nonparametric techniques
In this paper, we present a new statistical technique for estimation of average power dissipation in digital circuits. Present statistical techniques estimate the average power ba...
Li-Pen Yuan, Chin-Chi Teng, Sung-Mo Kang
ICIP
2005
IEEE
16 years 8 months ago
Statistical restoration for robust and secure steganography
We investigate data hiding techniques that attempt to defeat steganalysis by restoring the statistics of the composite image to resemble that of the cover. The approach is to rese...
Kaushal Solanki, Kenneth Sullivan, Upamanyu Madhow...
DAC
2007
ACM
16 years 7 months ago
Confidence Scalable Post-Silicon Statistical Delay Prediction under Process Variations
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
Qunzeng Liu, Sachin S. Sapatnekar