6367 search results - page 160 / 1274 » From Statistics to Beliefs |
190
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CODES
2007
IEEE
16 years 23 days ago
2007
IEEE
Embedded single-chip heterogeneous multiprocessor (SCHM) systems experience frequent system events such as task preemption, power-saving voltage/frequency scaling, or arrival of n...
163
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DPHOTO
2009
15 years 4 months ago
2009
The lifetime of solid-state image sensors is limited by the appearance of defects, particularly hot-pixels, which we have previously shown to develop continuously over the sensor ...
178
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ANSS
2007
IEEE
16 years 23 days ago
2007
IEEE
Accurate failure prediction in Grids is critical for reasoning about QoS guarantees such as job completion time and availability. Statistical methods can be used but they suffer f...
149
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VTS
2006
IEEE
16 years 13 days ago
2006
IEEE
A statistical technique X-IDDQ for extracting defect information from IDDQ data is presented that is effective for detection of defects in ICs. The technique treats the IDDQ measu...
142
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ISNN
2005
Springer
15 years 12 months ago
2005
Springer
This paper presents two non-parametric statistical test methods, called Kolmogorov-Smirnov (KS) and U statistic test methods, respectively, for informative gene selection of a tumo...