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220
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MICRO
2003
IEEE
16 years 3 days ago
2003
IEEE
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Techniques to deal with these transient faults exist, but come at a cost. Designers...
195
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NDSS
2003
IEEE
16 years 3 days ago
2003
IEEE
Today’s architectures for intrusion detection force the IDS designer to make a difficult choice. If the IDS resides on the host, it has an excellent view of what is happening i...
181
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SSDBM
2003
IEEE
16 years 3 days ago
2003
IEEE
With increased demand for storage of scientific data comes a corresponding demand for efficient retrieval mechanisms necessary for analytical and reporting purposes. As is often...
176
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WCRE
2003
IEEE
16 years 3 days ago
2003
IEEE
Reverse Engineering is a process fraught with imperfections. The importance of dealing with non-precise, possibly inconsistent data explicitly when interacting with the reverse en...
160
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SIGDOC
2003
ACM
16 years 3 days ago
2003
ACM
In this paper, we introduce an analysis of the requirements and design choices for hands-free documentation. Hands-busy tasks such as cooking or car repair may require substantial...