Emerging 3D chips stacking and MEMS/Sensors packaging technologies are using DRIE (Deep Reactive Ion Etching) to etch Through-Silicon Via (TSV) for advanced interconnections. The ...
M. Puech, Jean-Marc Thevenoud, J. M. Gruffat, N. L...
A key challenge in devising solutions to a range of problems associated with business process management: process life cycle management, compliance management, enterprise process ...
In this paper, we formalize the digital library (DL) integration problem and propose an overall approach based on the 5S (streams, structures, spaces, scenarios, and societies) fr...
Abstract. This paper shows that we can take advantage of information about the probabilities of the occurrences of events, when this information is available, to refine the classic...
d Abstract) Sara Ahmadian∗ Chaitanya Swamy∗ We consider the lower-bounded facility location (LBFL) problem (also sometimes called load-balanced facility location), which is a ...