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ASPDAC
2005
ACM
107views Hardware» more  ASPDAC 2005»
15 years 8 months ago
Constraint extraction for pseudo-functional scan-based delay testing
Recent research results have shown that the traditional structural testing for delay and crosstalk faults may result in over-testing due to the non-trivial number of such faults t...
Yung-Chieh Lin, Feng Lu, Kai Yang, Kwang-Ting Chen...
ASPDAC
2005
ACM
111views Hardware» more  ASPDAC 2005»
15 years 8 months ago
Wave-pipelined on-chip global interconnect
— A novel wave-pipelined global interconnect system is developed for reliable, high throughput, on-chip data communication. We argue that because there is only a single signal pr...
Lizheng Zhang, Yuhen Hu, Charlie Chung-Ping Chen
CF
2005
ACM
15 years 8 months ago
Owl: next generation system monitoring
As microarchitectural and system complexity grows, comprehending system behavior becomes increasingly difficult, and often requires obtaining and sifting through voluminous event ...
Martin Schulz, Brian S. White, Sally A. McKee, Hsi...
DAC
2005
ACM
15 years 8 months ago
Path delay test compaction with process variation tolerance
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, T...
DOLAP
2005
ACM
15 years 8 months ago
Towards a spatial multidimensional model
Data warehouses and OLAP systems help to interactively analyze huge volume of data. This data, extracted from transactional databases, frequently contains spatial information whic...
Sandro Bimonte, Anne Tchounikine, Maryvonne Miquel
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