23119 search results - page 4299 / 4624 » From Domain to Requirements |
178
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ALT
2004
Springer
16 years 3 months ago
2004
Springer
Different formal learning models address different aspects of learning. Below we compare learning via queries—interpreting learning as a one-shot process in which the learner i...
152
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ICCD
2007
IEEE
16 years 3 months ago
2007
IEEE
Scan chains are widely used to improve the testability of IC designs. In traditional 2D IC designs, various design techniques on the construction of scan chains have been proposed...
153
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
— We have entered an era where chip yields are decreasing with scaling. A new concept called intelligible testing has been previously proposed with the goal of reversing this tre...
157
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
— Caches, block memories, predictors, state tables, and other forms of on-chip memory are continuing to consume a greater portion of processor designs with each passing year. Mak...
180
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
— The influence of interconnects on processor performance and cost is becoming increasingly pronounced with technology scaling. In this paper, we present a fast compression sche...