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ASPDAC
2001
ACM
82views Hardware» more  ASPDAC 2001»
15 years 10 months ago
Towards the logic defect diagnosis for partial-scan designs
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
Shi-Yu Huang
DBSEC
2004
97views Database» more  DBSEC 2004»
15 years 8 months ago
Configuring Storage Area Networks for Mandatory Security
Storage-area networks are a popular and efficient way of building large storage systems both in an enterprise environment and for multi-domain storage service providers. In both en...
Benjamin Aziz, Simon N. Foley, John Herbert, Garre...
JMLR
2010
137views more  JMLR 2010»
15 years 1 months ago
HOP-MAP: Efficient Message Passing with High Order Potentials
There is a growing interest in building probabilistic models with high order potentials (HOPs), or interactions, among discrete variables. Message passing inference in such models...
Daniel Tarlow, Inmar Givoni, Richard S. Zemel
DEXAW
2008
IEEE
98views Database» more  DEXAW 2008»
16 years 1 months ago
Interface for Multidisciplinary Virtual Prototype Components
Computer-based concurrent engineering of products, denoted as Virtual Engineering (VE), is used extensively to meet the requirements of product development. Current research deals...
Stephan Vornholt, Ingolf Geist
WSC
2008
15 years 8 months ago
Practical approach to experimentation in a simulation study
Simulation study of complex production facilities can be a challenging task for manufacturing engineers as it requires skills to build the models and to conduct experiments. Accur...
Benny Tjahjono, Raul Fernandez