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TCAD
2008
114views more  TCAD 2008»
15 years 6 months ago
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
Zhanglei Wang, Krishnendu Chakrabarty
VIS
2007
IEEE
80views Visualization» more  VIS 2007»
16 years 7 months ago
Topologically Clean Distance Fields
Analysis of materials obtained from physical simulations is important in the physical sciences. Our research was motivated by the need to investigate the properties of a simulated...
Attila G. Gyulassy, Mark A. Duchaineau, Vijay Na...
TON
2008
103views more  TON 2008»
15 years 6 months ago
On the race of worms, alerts, and patches
We study the effectiveness of automatic patching and quantify the speed of patch or alert dissemination required for worm containment. We focus on random scanning as this is repres...
Milan Vojnovic, Ayalvadi J. Ganesh
SAC
2004
ACM
15 years 11 months ago
An optimized approach for KNN text categorization using P-trees
The importance of text mining stems from the availability of huge volumes of text databases holding a wealth of valuable information that needs to be mined. Text categorization is...
Imad Rahal, William Perrizo
DATAMINE
2006
142views more  DATAMINE 2006»
15 years 6 months ago
Sequential Pattern Mining in Multi-Databases via Multiple Alignment
To efficiently find global patterns from a multi-database, information in each local database must first be mined and summarized at the local level. Then only the summarized infor...
Hye-Chung Kum, Joong Hyuk Chang, Wei Wang 0010